Etude par CASINO de l’effet d’un faisceau d’électrons sur les polymères
Abstract
Since their discovery, polymers have increasingly replaced other materials (metal, glass, wood, etc.) because of their low cost and their relatively easy shaping. In order to study the stability of a polymer to electron beam irradiation, we chose to use a famous method for the study of electron-matter interaction that is known as Monte Carlo simulation by the CASINO program, and we applied it to evaluate the damage performed. The results of the simulation allowed us to define the electron-polymer interaction volume and the depth profile of the electrons as a function of their initial energy (5 keV), which allowed us to assess the volume susceptible to damage by the electrons. We were also able to determine the minimum grain sizes of the charges to be added as a function of the incident energy (1, 3, 5, 10, 20 keV) to improve the stability of the polymer.
References
A. Vahdat, H. Brahimi, N. Ansari, F. Ziaie. Radiation Grafting of Styrene onto Polypropylene Fibres by a 10 MeV Electron Beam. Radiation Physics and Chemistry 2007; 76(5):787–793.
H. I. Amols, B. Lagueux, D. Cagna. Radiobiological Effectiveness (RBE) of Megavoltage X-Ray and Electron Beams in Radiotherapy. Radiation Research 1986;105(1):58–67.
K. Indykiewicz, B. Paszkiewicz, R. Paszkiewicz. Substrate Effect in Electron Beam Lithography. Applied Physics 2018;16(2):246–252.
R. F. Egerton, P. Li, M. Malac. Radiation damage in the TEM and SEM . Micron 2004;35(6):399–409.
D. Drouin, A. R. Couture, D. Joly, X Tastet, V. Aimez, R. Gauvin. CASINO V2.42—A Fast and Easy-to-use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users. Scanning 2007;29(3):92–101.
A. Zoukel, L. Khouchaf, C. Arnoult, J. Di Martino, D. Ruch. A new approach to reach the best resolution of X-ray microanalysis in the variable pressure SEM. Micron 2013;46: 12–21.
A. Zoukel, L. Khouchaf, J. Di Martino, D. Ruch. Interfacial Energy-Dispersive Spectroscopy Profile X-Ray Resolution Measurements in Variable Pressure SEM. Microscopy and Microanalysis 2014;20(5):1565–1575.
C. Arnoult, J. Di Martino, D. Ruch. Prediction and limitation of polymer degradation in Environmental SEM. Ultramicroscopy 2012;122:32–36.
K. Varlot, J.M. Martin, C. Quet. EELS analysis of PMMA at high spatial resolution. Micron 2001;32(4):371–378.
Z. G. Wang, X. T. Zu, X. Xiang. Preparation and characterization of polymer/inorganic nanoparticle composites through electron irradiation. Journal of Materials Science 2006;41:1973–1978.
D. Boulerba, A. Zoukel, M. B. Taouti. Effect of Some Solvents on the Molecular Interaction between Filler/Matrix: Case of PMMA/SiO2 Nanocomposites. Revue Roumaine de Chimie 2020;65(5) :461–466.
J. L. Droulas, Y. Jugnet, T. M. Duc. "In Situ" XPS Investigation of Polymers Metallized by Evaporation. Metallized Plastics 1992;3:123–140.
P. Hovington, D. Drouin, R. Gauvin. CASINO: A New Monte Carlo Code in C Language for Electron Beam Interaction —Part I: Description of the Program. Scanning 1997;19(1):1–14.